Talwar, Somit : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (14)
Les plus populaires
Liste
- Liste
- Tableau

1

Varying implant dose rate for defect reduction in laser thermal processing

Heather Banisaukas, Kevin S Jones, Somit Talwar, Dan F Downey, Scott Falk

Journal:

Materials Science in Semiconductor Processing

Année:

2001

Langue:

english

Fichier:

PDF, 383 KB

english, 2001

2

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Laser thermal annealed SSR well prior to epi-channel growth (LASPE) for 70 nm nFETS

Jung-Ho Lee,, Jeongyoub Lee,, Somit Talwar,, Yun Wang,, Daehee Weon,, Seungho Hahn,, Changyong Kang,, Taeeun Hong,, Younggwan Kim,, Haewang Lee,, Seokkiu Lee,, Jaesung Roh,, Daegwan Kang,

Année:

2000

Langue:

english

Fichier:

PDF, 393 KB

english, 2000

3

Crystallinity, strain, and thermal stability of heteroepitaxial Si1−xGex/Si (100) layers created using pulsed laser induced epitaxy

Kramer, K.-Josef, Talwar, Somit, Sigmon, Thomas W., Weiner, Kurt H.

Journal:

Applied Physics Letters

Année:

1992

Langue:

english

Fichier:

PDF, 669 KB

english, 1992

4

Laser-induced lateral epitaxy in fully depleted silicon-on-insulator junctions

Dezfulian, Kevin K., Krusius, J. Peter, Thompson, Michael O., Talwar, Somit

Journal:

Applied Physics Letters

Année:

2002

Langue:

english

Fichier:

PDF, 515 KB

english, 2002

5

Heteroepitaxial Si/Si1−xGex/Si structures produced using pulsed UV-laser processing

Kramer, K.-Josef, Talwar, Somit, Sigmon, Thomas W., Weiner, Kurt H.

Journal:

Applied Physics Letters

Année:

1994

Langue:

english

Fichier:

PDF, 658 KB

english, 1994

6

Resistless, area-selective ultrashallow P+/N junction fabrication using projection gas immersion laser doping

Kramer, K.-Josef, Talwar, Somit, Lewis, Isabella T., Davison, John E., Williams, Kenneth A., Benton, Keith A., Weiner, Kurt H.

Journal:

Applied Physics Letters

Année:

1996

Langue:

english

Fichier:

PDF, 330 KB

english, 1996

7

Drive Current Enhancement in Sub-50 nm CMOS by Reduction of SDE Resistance with Laser Thermal Process

Yamamoto, Tomonari, Goto, Ken-ichi, Kubo, Tomohiro, Wang, Yun, Lin, Tim, Talwar, Somit, Kase, Masataka, Sugii, Toshihiro

Journal:

Journal of The Electrochemical Society

Année:

2004

Langue:

english

Fichier:

PDF, 483 KB

english, 2004

8

Suppression of Gate Depletion in p + -Polysilicon-Gated Sub-40 nm pMOSFETs by Laser Thermal Processing

Yamamoto, Tomonari, Kubo, Tomohiro, Okabe, Ken-ichi, Sukegawa, Takae, Wang, Yun, Lin, Tengshing, Talwar, Somit, Kase, Masataka

Journal:

Japanese Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 520 KB

english, 2005

9

Shallow Junction Formation in Silicon: Dopant Incorporation and Diffusion Through Tungsten Silicide Films Using Gas Immersion Laser Doping (Gild)

Ishida, Emi, Kramer, K. -Josef, Talwar, Somit, Sigmon, Thomas W., Weiner, Kurt H., Lynch, William T.

Journal:

MRS Proceedings

Année:

1992

Langue:

english

Fichier:

PDF, 1.35 MB

english, 1992

10

Laser-Assisted TiSi2 Formation for ULSI Applications

Shamma, Nader, Talwar, Somit, Verma, Gaurav, Kramer, Karl-Josef, Farrar, Nigel, Chi, Chiu, Greene, Wayne, Weiner, Kurt

Journal:

MRS Proceedings

Année:

1997

Langue:

english

Fichier:

PDF, 1.72 MB

english, 1997

11

Defect Reduction in Laser Thermal Processing

Banisaukas, Heather, Jones, Kevin S., Talwar, Somit, Falk, Scott, Downey, Dan F.

Journal:

MRS Proceedings

Année:

2000

Langue:

english

Fichier:

PDF, 37 KB

english, 2000

12

Nonmelt Laser Annealing of 1 Kev Boron Implanted Silicon

Earles, Susan, Law, Mark, Jones, Kevin, Talwar, Somit, Corcoran, Sean

Journal:

MRS Proceedings

Année:

2001

Langue:

english

Fichier:

PDF, 287 KB

english, 2001

13

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Device Technology II - Laser thermal processing for shallow junction and silicide formation

Talwar, Somit, Verma, Gaurav, Weiner, Kurt H., Gelatos, Carol, Burnett, David, Wristers, Dirk, Tsuchiya, Toshiaki

Année:

1998

Langue:

english

Fichier:

PDF, 1.73 MB

english, 1998

14

Effect of Laser Thermal Processing on Defect Evolution in Silicon

Kuryliw, Erik, Jones, Kevin S., Sing, David, Rendon, Michael J., Talwar, Somit

Journal:

MRS Proceedings

Année:

2002

Fichier:

PDF, 810 KB

2002